Residual images in charged-coupled device detectors
نویسندگان
چکیده
منابع مشابه
Charge-coupled device area x-ray detectors
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Residual bulk image (RBI) is significant in the KAF09000 CCD. Residual images are observed 2 h after illumination at −20C. Trap leakage and capacity are studied as a function of temperature. A flood-flush protocol is evaluated for eliminating RBI artifacts. A substrate trap fixed pattern noise is observed and is removed by dark-subtraction. An increase of dark current shot noise due to trap lea...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2002
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.1470234